Built-In Test (BIT)

X-ES Built-In Test (BIT) software provides exceptional test coverage through Power-On BIT (PBIT), Continuous BIT (CBIT) and Initiated BIT (IBIT) routines. Integrated as a standard component of X-ES Board Support Packages (BSPs), X-ES BIT software requires no additional purchase.

The X-ES BIT software suite is provided in ANSI C source form and presents the user with the same consistent Application Programming Interface (API) for every X-ES product over every supported operating system. For example, all Intel® and Freescale based X-ES processor cards support a common set of BIT tests for common device interfaces such as SDRAM, Ethernet, and non-volatile storage.

Whether your goals are Fault Detection and Fault Isolation (FDFI) coverage during deployment, qualification testing, or manufacturing reliability, X-ES can work with you to deliver the BIT capabilities your project needs. For more details see the X-ES BIT Product Brief.